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					Wafer surface oil, it is difficult to detect, even if the KLA is also difficult to judge. It is mainly due to the detection principle…... If polluted wafer been utilized to extension, it will seriously affect the quality of the LED, and decrease wa...

					The flatness of the wafer is very important parameters which directly determine the wafer quality. Flatness Detection with many methods, it seems that most of them relying on the SEMI and ASTM standards. So, choose method, standards of parameters....

					The corrosion processes directly determine the result of dislocation; maybe one key point reminding can make you get good result, so please pay attention to the process.

					Optical crystal level is generally divided into six, and how to assess? This is not only requiring professional testing equipment, but also need a great deal of detection experience.

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					The Silicon Carbide Process Flow And The Detection Solution