- ? Instrument
- ? Instrument
- ? Instrument for Silicon Material
- ? Instrument for CZ&DSS
- ? Instrument for Wafer
- ? Instrument for Solar Cell
- ? Instrument for Module
- ? Instrument for PV Station
- ? LED instrument
- ? Other instrument
- ? Consumables
- ? Consumables
- ? Accessories
- ? Software
- ? Process software
- ? System software
- ? Application Software
- ? Intrument exchange
- ? Overview
- ? Exchange flow
- ? Exchange notice
- ? Exchange Center
- ? Maintenance Service
- ? PV Equipment Upgrades
- ? Auxiliary Equipment Maintenance
Product information:
The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
Flexible in use, and compatible with all types of photovoltaic devices, from silicon to 3rd generation devices, the PVE300 permits the quick and accurate determination of solar cell spectral response from which EQE (IPCE) can be determined, and, with the addition of determination of cell transmittance and reflectance, IQE, over a range up to 250-2.5μm.
Product Features:
■ Chopped, monochromatic probe, 0.2-7mm diameter
■ Wide range of operation 300-1200/1300/2500nm
■ Purpose–built, light-tight measurement chamber
■ 20x20cm temperature-controlled vacuum mount
■ Compatible with substrate, superstrate and packaged devices
■ Transformer or pre-amplifier & lock-in amplifier based detection
■ Device operation in short circuit or voltage-biased
■ Modular design permitting future extensions of capability
■ Choice of single or multiple channel bias sources
■ Calibrated reference Si and Ge detectors
■ 300mm focal length monochromator
■ Optional DC to 2Hz mode
■ Optional motorised XY stage
Technical information:
