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Product Brief:

       Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
 
Product’s feature: 

■ Can set alarm for heavy-dope value from 0.0 to 1.0. 

■ Can Indicate silicon type, P or N. 

■ Can clearly show resistivity with big screen.

■ Can eliminate the polysilicon without current with the help of current meter.

■ Can test wide range of resistivity, as it adopt special constant current technology.

■ Can be used for all kinds of silicon materials, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on; with integration of two probes, three probes and four probes.  

■ Heavy-doped Tweezer(two probes)：mainly to cope with little granular material, little broken IC Wafer and other little silicon material.

■ Three probes：unique design, very small and light, can show type and heavy doped simultaneously,  and the sorting efficiency is 2-3 times higher comparing to other probes. 

■ Four probes：show resistivity and currency in one test.

 

Work condition: 

1)temperature：23±2℃ 

2) humidity：60%~70% 

3) no strong magnetic field, far away from high frequency equipment.


 
Technique Specification: 

■ Hign Res. Range : 0.1~1000Ω﹡㎝

    Low Res. Range: 0.001~1.999Ω﹡㎝

■ Hign Res. Meature Precision: 0.1Ω﹡㎝ 

    Low Res. Meature Precision: 0.001Ω﹡㎝ 

■ Error area: 

Res.<1Ω﹡㎝: 10％±2LSB 

Res:1.01~50Ω﹡㎝: 20％±2LSB 

■ The Alarm Threshold can be set in the range of 0.0 to 1.0(Customed) 

■ Type measurement range: 0.1-1000Ω﹡㎝.

 

Typical Customer:

Hairun, Hengyu, CETC48, Yinkai, Shengyang and so on.